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A new extraction method of poly-Si TFT model parameters in the leakage regionWU, W. J; YAO, R. H; ZHENG, X. R et al.Solid-state electronics. 2007, Vol 51, Num 5, pp 778-783, issn 0038-1101, 6 p.Article

Virulence and outer membrane properties of a galU mutant of Klebsiella pneumoniae CG43CHANG, H.-Y; LEE, J.-H; DENG, W.-L et al.Microbial pathogenesis. 1996, Vol 20, Num 5, pp 255-261, issn 0882-4010Article

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STM induced photon emission from adsorbed porphyrin molecules on a Cu(100) surface in ultrahigh vacuumFUJITA, D; OHGI, T; DENG, W.-L et al.Surface science. 2000, Vol 454-56, pp 1021-1025, issn 0039-6028Conference Paper